Simposio 2010 La metrología, la productividad y el desarrollo económico CENAM
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Plenaria I 
 Dr. Patrick Gallagher – Director of the National Institute of Standards and Technology
The impact of national metrology institutes on the society and the economic development of countries
 
Plenaria II
Dr. Myungsoo Kim – President of Korea Reseach Institute of Standards and Science (KRISS)
The role of government supporting metrology, standards, science and technology in the development of economies 
 
Plenaria III
Biol. Aida Albuerne – Directora del Laboratorio Nacional de PROFECO.
Una medición correcta – Un consumo Justo 
 
Plenaria IV
Dr. Thomas O'Brian – Chief of the Time and Frequency Division of NIST
NIST’s work in time and frequency metrology, and how it impacts the economy and technology 
 
Plenaria V
Dr. Rainer Engel – Head of Working group of Hydrodynamic Test Field - PTB
Aspects and requirements of traceability in fluid flow measurement  
 
Plenaria VI
Dr. Eddy So – Research Officer, Electrical Power Measurements
NRC Power Quality and Smart Grid 
 
Plenaria VII
Dr. Héctor Nava – Director del CENAM
Un posible escenario de la metrología en los próximos años en el CENAM
 
Invitadas
Dra. Carol Hockert – Chief NIST Weights and Measures Division
“A Strategy for Pursuing Performance Excellence in Education and Training”