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PLENARIA I (Apertura)
Del Sistema Nacional de Calibración y Materiales de Referencia
Presentación
Francisco Ramos, DGN
PLENARIALegal Metrology under Construction: New Trends in Europe and Germany
Presentación
Peter Ulbig, PTB
PLENARIA III
Labeling Nanotech-Enabled Products to Advance Social Responsibility
Presentación
Tsung-Tsan Su
U.S. National Nanotechnology Initiative and Nanoscale Length Metrology at NIST
Presentación
Theodore Vorburger, NIST
PLENARIA IV
Femtosecond Laser Frequency Combs: The Gears of Optical Atomic Clocks
Presentación
Scott A. Diddams, NIST
PLENARIA V
Quantum Metrology Triangle and Determination of Charge Quantum
Presentación
Francois Piquemal, LNE
PLENARIA VI
A View of Key Recent Developments at LNE
Presentación
Jean-Remy Filtz, LNE
PLENARIA VII
NIST Perspectives on Metrology Needs to Support Emerging Technologies
Presentación
Claire Saundry, NIST
PLENARIA VIII
Current Challenges in Bio-Metrology: The JRC Support to Food Safety
Presentación
Alejandro Herrero, IRMM
PLENARIA IX
Fundamental Constants - The Ultimate Foundation of the SI
Presentación
Barry Wood, NRC
PLENARIA X
EURAMET Developing its New Role in European Metrology
Presentación
Wolfgang Schmid, EURAMET
PLENARIA XI (Cierre)
Presentación
Héctor Nava Jaimes
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